The automated detection of defects in high-angle annular dark-field Z-contrast (HAADF) scanning-transmission-electron microscopy (STEM) images has been a major challenge. Here, we report an appro...
https://ascimaging.springeropen.com/articles/10.1186/s40679-020-00070-x
Scanning transmission electron microscopy (STEM) at low energies (≤ 30 keV) in a scanning electron microscope is well suited to distinguish weakly scattering materials with similar materials ...
https://ascimaging.springeropen.com/articles/10.1186/s40679-020-00069-4
The standard technique for sub-pixel estimation of atom positions from atomic resolution scanning transmission electron microscopy images relies on fitting intensity maxima or minima with a two-d...
https://ascimaging.springeropen.com/articles/10.1186/s40679-020-0068-y
Hole-free phase plates (HFPPs), also known as Volta phase plates, were already demonstrated to be well suited for in-focus transmission electron microscopy imaging of organic objects. However, th...
https://ascimaging.springeropen.com/articles/10.1186/s40679-019-0067-z
STEM XEDS spectrum images can be drastically denoised by application of the principal component analysis (PCA). This paper looks inside the PCA workflow step by step on an example of a complex se...
https://ascimaging.springeropen.com/articles/10.1186/s40679-019-0066-0